Dr. Thomas H. Schramm

Dipl.-Phys. | Dr. rer. nat. | Patent Attorney Trainee

Areas of Practice

Physical technics; Measurement, control and automation engineering; Electrical engineering; Optics and laser technology; Data processing and programming; Nanotechnology; Ionoptics; Vacuum technology; Surface science

German, English

Professional Development
since 2014 Patent Attorney Trainee at KEIL & SCHAAFHAUSEN
2010–2014 Doctorate at the Physics Department of the University of Constance
2004–2010 Studies of physics at the University of Wuerzburg


Personal Information

1983 born in Aschaffenburg

Thomas Schramm has studied physics with subsidiary subjects in information technology, computational physics and geophysics at the Julius-Maximilian University in Wuerzburg. For several month he was working at the Texas Tech University in Lubbock, Texas as a Research Associate in the field of optical experiments on dielectric surface flashover. In the context of his diploma thesis he was working on low-dimensional electron systems on semiconductor surfaces. For his doctorate he developed a new method for examining nanoparticles at the synchrotron Swiss Light Source of the Paul-Scherrer Institut in Villigen, Switzerland.