Dr. Thomas H. Schramm
Dipl.-Phys. | Dr. rer. nat. | Patent Attorney Trainee
Physical technics; Measurement, control and automation engineering; Electrical engineering; Optics and laser technology; Data processing and programming; Nanotechnology; Ionoptics; Vacuum technology; Surface science
|since 2014||Patent Attorney Trainee at KEIL & SCHAAFHAUSEN|
|2010–2014||Doctorate at the Physics Department of the University of Constance|
|2004–2010||Studies of physics at the University of Wuerzburg|
1983 born in Aschaffenburg
Thomas Schramm has studied physics with subsidiary subjects in information technology, computational physics and geophysics at the Julius-Maximilian University in Wuerzburg. For several month he was working at the Texas Tech University in Lubbock, Texas as a Research Associate in the field of optical experiments on dielectric surface flashover. In the context of his diploma thesis he was working on low-dimensional electron systems on semiconductor surfaces. For his doctorate he developed a new method for examining nanoparticles at the synchrotron Swiss Light Source of the Paul-Scherrer Institut in Villigen, Switzerland.